Standard

JEDEC JEP180.01

Published

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Abstract

This publication presents guidelines for evaluating the switching reliability of GaN power switches. It is applicable to planar enhancement-mode, depletion-mode, GaN integrated power solutions and cascode GaN power switches. It covers the following aspects: a) An approach for broad coverage, using the switching locus to represent switching stress in a standardized manner. b) The development of a lifetime model, based upon the type of application switching locus. c) The validation of reliable operation under application-use conditions. The publication will result in common methods for representing, evaluating and modeling the switching stress on GaN power switches, and ensuring their reliable operation in an application.

Document information

  • Standard from JEDEC_AC
  • Published:
  • Version: 0
  • Document type: IS
  • Additional information
    • Version 1.0