Standard

IEC TS 62607-9-1:2021 ED1

Oct 2021 Published

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Abstract

IEC TS 62607-9-1:2021(E) establishes a standardized method to characterize spatially varying magnetic fields with a spatial resolution down to 10 nm for flat magnetic specimens by magnetic force microscopy (MFM). MFM primarily detects the stray field component perpendicular to the sample surface. The resolution is achieved by the calibration of the MFM tip using magnetically nanostructured reference materials.

Document information

Standard from IEC
Published: 14 October 2021
Edition: 1
Version: 1
Document type: TS
ISBN: 9782832243787

ICS 07.120
ISO TC TC 113

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Adopted by: NEK IEC 61280-2-5:1998

IEC TS 62607-9-1:2021 ED1

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Abstract

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Abstract

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