Standard

IEC PAS 62191:2000 ED1

Nov 2000 Replaced

Corrigendums and amendments are bought separately.

Language English

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Abstract

Defines the procedures for performing acoustic microscopy on nonhermetic encapsulated electronic components. Provides users with an acoustic microscopy process flow for detecting anomalies (delamination, cracks, mold compounds voids, etc.) nondestructively in plastic packages while achieving reproducibility.

Document information

Standard from IEC
Published: 28 November 2000
Withdrawn: 31 January 2002
Edition: 1
Version: 1
Document type: PAS
Pages
ISBN: 2831854695

ICS 31.080.01
ISO TC TC 47

Product Relations

Adopted by: NEK ISO/IEC 15961:2004

IEC PAS 62191:2000 ED1

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Abstract

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Abstract

Document information

Product Relations

Product life cycle