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Standard

IEC PAS 61338-1-5:2010 ED1

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Abstract

IEC/PAS 61338-1-5:2010(E) describes a measurement method for resistance and effective conductivity at the interface between conductor layer and dielectric substrate.

Document information

  • Standard from IEC
  • Published:
  • Withdrawn:
  • Edition: 1
  • Version: 1
  • Document type: PAS
  • ICS 31.140
  • ISO TC TC 49

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