Standard

IEC 62433-3:2017 ED1

Jan 2017 Published

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Abstract

IEC 62433-3:2017 provides a method for deriving a macro-model to allow the simulation of the radiated emission levels of an Integrated Circuit (IC). This model is commonly called Integrated Circuit Emission Model - Radiated Emission, ICEM-RE. The model is intended to be used for modelling a complete IC, with or without its associated package, a functional block and an Intellectual Property (IP) block of both analogue and digital ICs (input/output pins, digital core and supply), when measured or simulated data cannot be directly imported into simulation tools.

Document information

Standard from IEC
Published: 27 January 2017
Edition: 1
Version: 1
Document type: IS
Pages
ISBN:

ICS 31.200
ICS 33.100.10
ISO TC TC 47/SC 47A

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Adopted by: NEK IEC 60071-2:1996
FRANKFURT AGREEMENT: FprEN 62433-3:2016

IEC 62433-3:2017 ED1

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Abstract

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