Standard

IEC 62047-29:2017 ED1

Nov 2017 Published

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Language English

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Abstract

IEC 62047-29:2017(E) specifies a relaxation test method for measuring electromechanical properties of freestanding conductive thin films for micro-electromechanical systems (MEMS) under controlled strain and room temperature. Freestanding thin films of conductive materials are extensively utilized in MEMS, opto-electronics, and flexible/wearable electronics products. Freestanding thin films in the products experience external and internal stresses which could be relaxed even under room temperature during a period of operation, and this relaxation leads to time-dependent variation of electrical performances of the products. This test method is valid for isotropic, homogeneous, and linearly viscoelastic materials.

Document information

Standard from IEC
Published: 22 November 2017
Edition: 1
Version: 1
Document type: IS
ISBN: 9782832250464

ICS 31.080.99
ISO TC TC 47/SC 47F

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Adopted by: NEK IEC 60118-14:1998

IEC 62047-29:2017 ED1

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Abstract

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Abstract

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