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IEC 60749-1:2002 ED1

Aug 2002 Published

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Corrigendum 1 - Semiconductor devices - Mechanical and climatic test methods - Part 1: General Published IEC 60749-1:2002/COR1:2003 ED1 Corrigendum from Publication date: Aug 2003 Version: 1 Language: English/French Services: Read Online (No printing ), Printed and bound

Abstract

Applicable to semiconductor devices (discrete devices and integrated circuits) and establishes provisions common to all the other parts of the series. The contents of the corrigendum of August 2003 have been included in this copy.

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Standard from IEC
Published: 30 August 2002
Edition: 1
Version: 1
Document type: IS
Pages
ISBN:

ICS 31.080.01
ISO TC TC 47

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Partially replaces: IEC 60749:1996 ED2

IEC 60749-1:2002 ED1

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Version history Related corrigendum and amendments (1)

IEC 60749-1:2002/COR1:2003 ED1

Abstract

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