Standard

IEC 60147-0:1966 ED1

Withdrawn

Corrigendums and amendments are bought separately.

Language
Services

Abstract

Deals with essential ratings and characteristics of semiconductor devices and general principles of measuring methods. This publication is intended to be used in conjunction with IEC 147-1 and 147-2.

Document information

  • Standard from IEC
  • Published:
  • Withdrawn:
  • Edition: 1
  • Version: 1
  • Document type: IS
  • Pages
  • ICS 31.080.10
  • ISO TC TC 47

Product Relations